Multi-Layer Material Characterization at Ka-Band Using Bayesian Inversion Method

نویسندگان

چکیده

This paper presents the implementation of Bayesian inversion method for characterization and estimation different dielectric material properties. The scattering parameters single multi-layer materials are measured using a free-space experimental setup standard gain horn antenna Vector Network Analyzer (VNA) at Ka-band (26–40 GHz). relative permittivity, thickness, positioning error defined as model estimated observed (measured) data. FR4 Epoxy, Rogers RT/Duriod 5880, AD600 with permittivities thicknesses used in measurement setup. results displayed good agreement between properties presented materials, while corresponding eigenvectors provided level confidence parameter values. were compared reported techniques to showcase possible use microwave imaging, non-destructive testing, similar applications.

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ژورنال

عنوان ژورنال: Electronics

سال: 2023

ISSN: ['2079-9292']

DOI: https://doi.org/10.3390/electronics12030563